Research Catalog

Integrated analysis of error detection and recovery

Title
  1. Integrated analysis of error detection and recovery [microform] / Kang G. Shin and Yann-Hang Lee.
Published by
  1. Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1985]
Author
  1. Shin, Kang G.

Details

Additional authors
  1. Lee, Yann-Hang.
  2. Langley Research Center.
Description
  1. 1 v.
Series statement
  1. NASA contractor report ; 172571
Uniform title
  1. NASA contractor report ; NASA CR-172571.
Subject
  1. Computation
  2. Computer programs
  3. Error analysis
  4. Error detection codes
  5. Fault tolerance
Call number
  1. READEX Microfiche NAS 1.26:172571
Note
  1. Distributed to depository libraries in microfiche.
Reproduction (note)
  1. Microfiche.
Author
  1. Shin, Kang G.
Title
  1. Integrated analysis of error detection and recovery [microform] / Kang G. Shin and Yann-Hang Lee.
Imprint
  1. Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1985]
Series
  1. NASA contractor report ; 172571
  2. NASA contractor report ; NASA CR-172571.
Reproduction
  1. Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1985] 2 microfiches.
Added author
  1. Lee, Yann-Hang.
  2. Langley Research Center.
Gpo item no.
  1. 0830-H-14 (MF)
Sudoc no.
  1. NAS 1.26:172571
Research call number
  1. READEX Microfiche NAS 1.26:172571
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