Research Catalog

Details

Additional authors

1. Shwop, John E.
2. Von Alven, William H.
3. United States. Advisory Group on Electron Tubes.
4. Aerospace Industries Association of America.
5. Conference on Reliability of Semiconductor Devices (1961 : New York, N.Y.)
6. Conference on Reliability Assurance Techniques for Semiconductor Specifications (1961 : Washington, D.C.)

Description

1. 2 volumes illustrations, diagrams, tables; 24 cm

Subject

1. Semiconductors > Reliability > Congresses
2. Semiconductors > Reliability

Genre/Form

1. Conference papers and proceedings.

Contents

1. [Vol. 1]: Based on the Conference on reliability of semiconductor devices, 1961 ... / edited by John E. Shwop [and] Harold J. Sullivan -- Vol. 2: Based on the Conference on reliability assurance techniques for semiconductor specifications, October 1961, Washington, DC ... / edited by William H. Von Alven.

Owning institution

1. Princeton University Library

Note

1. Vol. [1]: Based on the Conference on Reliability of Semiconductor Devices, 1961, sponsored by the Working Group on Semiconductor Devices, Advisory Group on Electron Tubes, Dept. of Defense. Edited by John E. Shwop [and] Harold J. Sullivan.
2. Vol. 2: Based on the Conference on Reliability Assurance Techniques for Semiconductor Specifications, October 1961, Washington, D.C., sponsored by Aerospace Industries Association [and others] Edited by William H. Von Alven.

Bibliography (note)

1. Includes bibliographies.