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A computer software package for statisticsl [sic] pattern recognition / by Chi-hau Chen, Maisie Fan.
Text
North Dartmouth, Mass. : Southeastern Massachusetts University, Electrical Engineering Dept., [1974]
1974
1 item
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FormatBook/Text | Call numberJSF 85-252 | Item locationOffsite |
Colloque international sur la reconnaissance de forme. International Conference on "Pattern Recognition," Grenoble 11-13 septembre 1968 ...
Text
[Grenoble?] Laboratoire d'électronique et de technologie de l'informatique, 1969.
1969
1 item
Format | Call number | Item location |
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FormatBook/Text | Call numberJSE 71-146 | Item locationOffsite |
Pattern recognition; proceedings. Edited by Laveen N. Kanal.
Text
Washington, Thompson Book Co., 1968.
1968
1 item
Format | Call number | Item location |
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FormatBook/Text | Call numberJSE 72-744 | Item locationOffsite |
Introduction to mathematical techniques in pattern recognition [by] Harry C. Andrews.
Text
New York, Wiley-Interscience [1972]
1972
1 item
Format | Call number | Item location |
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FormatBook/Text | Call numberJSD 73-188 | Item locationOffsite |
Pattern apprehension: the development of international representations. [By] Abram R. W. Muijen.
Text
Amsterdam, Swets & Zeitlinger, 1972.
1972
1 item
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJFE 73-851 | Item locationSchwarzman Building - General Research Room 315 |
Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
Pattern recognition: introduction and foundations.
Text
Stroudsburg, Pa., Dowden, Hutchinson & Ross [1973]
1973
1 item
Format | Call number | Item location |
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FormatBook/Text | Call numberJSF 74-185 | Item locationOffsite |
Psychological processes in pattern recognition [by] Stephen K. Reed.
Text
New York, Academic Press, 1973.
1973
1 item
Format | Call number | Item location |
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FormatBook/Text | Call numberJFE 74-1805 | Item locationSchwarzman Building - General Research Room 315 |
Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
Methodologies of pattern recognition; [proceedings] Edited by Satosi Watanabe.
Text
New York, Academic Press, 1969.
1969
1 item
Format | Call number | Item location |
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FormatBook/Text | Call numberJSE 74-1297 | Item locationOffsite |
Syntactic methods in pattern recognition [by] K. S. Fu.
Text
New York, Academic Press, 1974.
1974
1 item
Format | Call number | Item location |
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FormatBook/Text | Call numberJSE 75-239 | Item locationOffsite |
Pattern recognition principles [by] Julius T. Tou [and] Rafael C. Gonzalez.
Text
Reading, Mass., Addison-Wesley Pub. Co., 1974.
1974
1 item
Format | Call number | Item location |
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FormatBook/Text | Call numberJSE 75-664 | Item locationOffsite |
Chemical applications of pattern recognition / Peter C. Jurs, Thomas L. Isenhour.
Text
New York : Wiley, [1975]
1975
1 item
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FormatBook/Text | Call numberJSE 75-772 | Item locationOffsite |
Patterns and configurations in economic science, by J. M. Blin.
Text
Dordrecht, Holland, Boston, D. Reidel Pub. Co. [1973]
1973
1 item
Format | Call number | Item location |
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FormatBook/Text | Call numberJLD 75-1878 | Item locationOffsite |
Recognition of patterns using the frequencies of occurrence of binary words [by] Peter W. Becker. 2d rev. ed.
Text
Wien, New York, Springer-Verlag [1974]
1974
1 item
Format | Call number | Item location |
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FormatBook/Text | Call numberJSD 75-1070 | Item locationOffsite |
Raspoznavanie obrazov.
Text
Riga, Izd-vo "Zinatne", 1974-
1974-19
2 items
Format | Call number | Item location |
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FormatBook/Text | Call number*QHA 75-948 v. 2 | Item locationOffsite |
Format | Call number | Item location |
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FormatBook/Text | Call number*QHA 75-948 v. 1 | Item locationOffsite |
Classification, estimation, and pattern recognition [by] Tzay Y. Young [and] Thomas W. Calvert.
Text
New York, American Elsevier Pub. Co. [1974]
1974
1 item
Format | Call number | Item location |
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FormatBook/Text | Call numberJSD 75-1251 | Item locationOffsite |
Practical approach to pattern classification / Bruce G. Batchelor.
Text
London ; New York : Plenum Press, 1974.
1974
1 item
Format | Call number | Item location |
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FormatBook/Text | Call numberJSE 77-26 | Item locationOffsite |
Methoden der Mustererkennung.
Text
Frankfurt am Main, Akademische Verlagsgesellschaft, 1974.
1974
1 item
Format | Call number | Item location |
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FormatBook/Text | Call numberJSD 76-868 | Item locationOffsite |
Fuzzy sets and their applications to cognitive and decision processes : [papers] / edited by Lofti A. Zadeh ... [et al.].
Text
New York : Academic Press, 1975.
1975
1 item
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJSE 76-206 | Item locationOffsite |
Digital pattern recognition / edited by K. S. Fu ; with contributions by T. M. Cover ... [et al.].
Text
Berlin ; New York : Springer-Verlag, 1976.
1976
1 item
Format | Call number | Item location |
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FormatBook/Text | Call numberJSE 76-799 | Item locationOffsite |
Syntactic pattern recognition : applications / edited by K. S. Fu ; with contributions by J. E. Albus ... [et al.].
Text
Berlin ; New York : Springer-Verlag, 1977.
1977
1 item
Format | Call number | Item location |
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FormatBook/Text | Call numberJSE 77-677 | Item locationOffsite |
Proceedings.
Text
Long Beach, Calif., Institue of Electrical and Electronics Engineers.
1973-1978
4 items
Format | Call number | Item location |
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FormatBook/Text | Call numberJSP 77-531 v. 4 (1978) | Item locationOffsite |
Format | Call number | Item location |
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FormatBook/Text | Call numberJSP 77-531 v. 3 (1976) | Item locationOffsite |
Format | Call number | Item location |
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FormatBook/Text | Call numberJSP 77-531 v. 2 (1974) | Item locationOffsite |
Conference record / 1976 Joint Workshop on Pattern Recognition and Artifical Intelligence, held at Hyannis, Massachusetts, June 1-3, 1976 ; sponsored by IEEE Computer Society.
Text
Long Beach, CA : The Society, c1976.
1976
1 item
Format | Call number | Item location |
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FormatBook/Text | Call numberJSF 78-98 | Item locationOffsite |
Pattern recognition theory and application : [proceedings of the NATO Advanced Study Institute on Pattern Recognition-Theory and Application, Bandol, France, September 1975] / edited by K. S. Fu and A. B. Whinston.
Text
Leyden : Noordhoff, 1977.
1977
1 item
Format | Call number | Item location |
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FormatBook/Text | Call numberJSK 75-267 no. 22 v. 22 | Item locationOffsite |
Syntactic pattern recognition : an introduction / Rafael C. Gonzalez, Michael G. Thomason.
Text
Reading, Mass. : Addison-Wesley Pub. Co., Advanced Book Program, 1978.
1978
1 item
Format | Call number | Item location |
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FormatBook/Text | Call numberJSE 79-287 | Item locationOffsite |
Pattern recognition : ideas in practice / edited by Bruce G. Batchelor.
Text
New York : Plenum Press, c1978.
1978
1 item
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJSE 79-360 | Item locationOffsite |
Polynomklassifikatoren für die Zeichenerkennung : Ansatz, Adaption, Anwendungen / von Jürgen Schürmann. 1. Aufl.
Text
München ; Wien : Oldenbourg, 1977.
1977
1 item
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJSE 79-711 | Item locationOffsite |
Proceedings, PRIP78, May 31-June 2, 1978, Chicago, Illinois : IEEE Computer Society Conference on Pattern Recognition and Image Processing.
Text
Long Beach, Calif. : IEEE Computer Society, c1978.
1978
1 item
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJSF 79-841 | Item locationOffsite |
IEEE transactions on pattern analysis and machine intelligence.
Text
[New York] IEEE Computer Society.
1979-present
51 items
Format | Call number | Item location |
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FormatBook/Text | Call numberJSP 85-603 v. 30, no. 4 (Apr 2008) | Item locationOffsite |
Format | Call number | Item location |
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FormatBook/Text | Call numberJSP 85-603 v. 30, no. 3 (Mar 2008) | Item locationOffsite |
Format | Call number | Item location |
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FormatBook/Text | Call numberJSP 85-603 v. 30, no. 2 (Feb 2008) | Item locationOffsite |
Structural pattern recognition / T. Pavlidis.
Text
Berlin ; New York : Springer-Verlag, 1977.
1977
1 item
Format | Call number | Item location |
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FormatBook/Text | Call numberJSE 80-158 | Item locationOffsite |
Pattern formation by dynamic systems and pattern recognition : proceedings of the International Symposium on Synergetics at Schloss Elmau, Bavaria / editor, H. Haken.
Text
Berlin ; New York : Springer-Verlag, 1979.
1979
1 item
Format | Call number | Item location |
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FormatBook/Text | Call numberJSE 81-1024 | Item locationOffsite |
Grundlagen der technischen Erkennung / Rolf Peipmann. 1. Aufl.
Text
Berlin : Verlag Technik, 1975.
1975
1 item
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJSD 81-110 | Item locationOffsite |
Reconnaissance des formes et intelligence artificielle : 2. congrès AFCET-IRIA, Toulouse, 12, 13 14 septembre 1979 / [édité par l'Institut de recherche d'informatique et d'automatique].
Text
Rocquencourt : Institut de recherche d'informatique et d'automatique, 1979.
1979
2 items
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJSE 82-258 v. 2-3 | Item locationOffsite |
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJSE 82-258 v. 1 | Item locationOffsite |
Pattern recognition theory and applications : proceedings of the NATO Advanced Study Institute held at St. Anne's College, Oxford, March 29-April 10, 1981 / edited by J. Kittler, K.S. Fu, and L.F. Pau.
Text
Dordrecht, Holland ; Boston : D. Reidel ; Hingham, MA : Sold and distributed in the U.S.A. and Canada by Kluwer Boston, c1982.
1982
1 item
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJSE 82-436 | Item locationOffsite |
Pattern recognition with fuzzy objective function algorithms / James C. Bezdek.
Text
New York : Plenum Press, c1981.
1981
1 item
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJSE 81-1646 | Item locationOffsite |
Pattern recognition : a statistical approach / Pierre A. Devijver and Josef Kittler.
Text
Englewood Cliffs, N.J. : Prentice/Hall International, c1982.
1982
1 item
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJSE 83-337 | Item locationOffsite |
Proceedings / International Conference on Pattern Recognition.
Text
[New York] : Institute of Electrical and Electronics Engineers, c1980-
1980-present
11 items
Format | Call number | Item location |
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FormatBook/Text | Call numberJSP 83-31 1994:v. 3 | Item locationOffsite |
Format | Call number | Item location |
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FormatBook/Text | Call numberJSP 83-31 1994:v. 2 | Item locationOffsite |
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJSP 83-31 1994:v. 1 | Item locationOffsite |
Proceedings / IEEE Computer Society Conference on Pattern Recognition and Image Processing.
Text
New York : Institute of Electrical and Electronics Engineers, 1977-1982.
1977-1982
3 items
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJSP 83-203 1979 | Item locationOffsite |
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJSP 83-203 1981 | Item locationOffsite |
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJSP 83-203 1982 | Item locationOffsite |
Proceedings : CVPR / IEEE Computer Society Conference on Computer Vision and Pattern Recognition.
Text
Silver Spring, Md. : IEEE Computer Society Press, 1983-
1983-present
21 items
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJSP 83-204 v. 2 (2005) | Item locationOffsite |
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJSP 83-204 v. 2 (2004) | Item locationOffsite |
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJSP 83-204 v. 2 (2003) | Item locationOffsite |
Learning systems : decision, simulation, and control / Yousri M. El-Fattah, Claude Foulard.
Text
Berlin ; New York : Springer-Verlag, 1978.
1978
1 item
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJSE 84-622 | Item locationOffsite |
Fuzzy mathematical approach to pattern recognition / Sankar K. Pal, Dwijesh K. Dutta Majumder.
Text
New York : Wiley, c1986.
1986
1 item
Format | Call number | Item location |
---|---|---|
FormatText | Call numberJSE 88-1776 | Item locationOffsite |
Structural methods in pattern recognition / by Laurent Miclet ; translated by J. Howlett.
Text
New York : Springer-Verlag, 1986.
1986
1 item
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJSE 87-1445 | Item locationOffsite |
Artificial intelligence with statistical pattern recognition / Edward A. Patrick, James M. Fattu.
Text
Englewood Cliffs, N.J. : Prentice-Hall, Business and Professional Division, c1986.
1986
1 item
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJSE 86-1801 | Item locationOffsite |
Subspace methods of pattern recognition / E. Oja.
Text
Letchworth, Hertfordshire, England : Research Studies Press ; New York : Wiley, c1983.
1983
1 item
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJSE 86-1752 | Item locationOffsite |
Knowledge as design / D.N. Perkins.
Text
Hillsdale, N.J. : L. Erlbaum Associates, 1986.
1986
1 item
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJFE 86-5116 | Item locationSchwarzman Building - General Research Room 315 |
Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
Temporal-pattern learning in neural models / Carme Torras i Genís.
Text
Berlin ; New York : Springer-Verlag, c1985.
1985
1 item
Format | Call number | Item location |
---|---|---|
FormatText | Call numberJSK 75-186 v. 62-64 | Item locationOffsite |
Pattern recognition mechanisms : proceedings of a Study Week / organized by The Pontifical Academy of Sciences, Casina Pius IV, Vatican City ; edited by Carlos Chagas, Ricardo Gattass, Charles Gross.
Text
Berlin ; New York : Springer-Verlag, 1985.
1985
1 item
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJSD 87-261 | Item locationOffsite |
Pattern recognition by humans and machines / [edited] by Eileen C. Schwab, Howard C. Nusbaum.
Text
Orlanda, Fla. : Academic Press, 1986.
1986
2 items
Format | Call number | Item location |
---|---|---|
FormatText | Call numberJFE 87-3826 | Item locationSchwarzman Building - General Research Room 315 |
Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
Format | Call number | Item location |
---|---|---|
FormatText | Call numberJFE 87-3826 v. 2 | Item locationSchwarzman Building - General Research Room 315 |
Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
Science on form : proceedings of the First International Symposium for Science on Form, University of Tsukuba, Japan, November 26-30, 1985 / general editor, S. Ishizaka ; editors, Y. Kato, R. Takaki, and J. Toriwaki.
Text
Tokyo : KTK Scientific Publishers ; Dordrecht ; Boston : D. Reidel ; Norwell, MA, U.S.A. : Sold and distributed in the U.S.A. and Canada by Kluwer Academic Publishers, c1987.
1987
1 item
Format | Call number | Item location |
---|---|---|
FormatText | Call numberJSE 87-2541 | Item locationOffsite |
Reconnaissance des formes et intelligence artificielle : 4ème congrès, Paris, 25-27 janvier 1984 / AFCET, Agence de l'informatique, INRIA.
Text
Paris : AFCET, [1984 or 1985]
1984
2 items
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJSE 87-2497 v. 2 | Item locationOffsite |
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJSE 87-2497 v. 1 | Item locationOffsite |
Potential pattern recognition in chemical and medical decision making / D. Coomans, I. Broeckaert.
Text
Letchworth, Hertfordshire, England : Research Studies Press ; New York : Wiley, c1986.
1986
1 item
Format | Call number | Item location |
---|---|---|
FormatBook/Text | Call numberJSE 87-2152 | Item locationOffsite |