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A computer software package for statisticsl [sic] pattern recognition / by Chi-hau Chen, Maisie Fan.

Text

North Dartmouth, Mass. : Southeastern Massachusetts University, Electrical Engineering Dept., [1974]

1974

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSF 85-252Item locationOffsite
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Colloque international sur la reconnaissance de forme. International Conference on "Pattern Recognition," Grenoble 11-13 septembre 1968 ...

Text

[Grenoble?] Laboratoire d'électronique et de technologie de l'informatique, 1969.

1969

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSE 71-146Item locationOffsite

Pattern recognition; proceedings. Edited by Laveen N. Kanal.

Text

Washington, Thompson Book Co., 1968.

1968

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSE 72-744Item locationOffsite

Introduction to mathematical techniques in pattern recognition [by] Harry C. Andrews.

Text

New York, Wiley-Interscience [1972]

1972

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSD 73-188Item locationOffsite

Pattern apprehension: the development of international representations. [By] Abram R. W. Muijen.

Text

Amsterdam, Swets & Zeitlinger, 1972.

1972

1 item

FormatCall numberItem location
FormatBook/TextCall numberJFE 73-851Item locationSchwarzman Building - General Research Room 315

Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

Pattern recognition: introduction and foundations.

Text

Stroudsburg, Pa., Dowden, Hutchinson & Ross [1973]

1973

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSF 74-185Item locationOffsite

Psychological processes in pattern recognition [by] Stephen K. Reed.

Text

New York, Academic Press, 1973.

1973

1 item

FormatCall numberItem location
FormatBook/TextCall numberJFE 74-1805Item locationSchwarzman Building - General Research Room 315

Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

Methodologies of pattern recognition; [proceedings] Edited by Satosi Watanabe.

Text

New York, Academic Press, 1969.

1969

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSE 74-1297Item locationOffsite

Syntactic methods in pattern recognition [by] K. S. Fu.

Text

New York, Academic Press, 1974.

1974

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSE 75-239Item locationOffsite

Pattern recognition principles [by] Julius T. Tou [and] Rafael C. Gonzalez.

Text

Reading, Mass., Addison-Wesley Pub. Co., 1974.

1974

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSE 75-664Item locationOffsite

Chemical applications of pattern recognition / Peter C. Jurs, Thomas L. Isenhour.

Text

New York : Wiley, [1975]

1975

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSE 75-772Item locationOffsite

Patterns and configurations in economic science, by J. M. Blin.

Text

Dordrecht, Holland, Boston, D. Reidel Pub. Co. [1973]

1973

1 item

FormatCall numberItem location
FormatBook/TextCall numberJLD 75-1878Item locationOffsite

Recognition of patterns using the frequencies of occurrence of binary words [by] Peter W. Becker. 2d rev. ed.

Text

Wien, New York, Springer-Verlag [1974]

1974

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSD 75-1070Item locationOffsite

Raspoznavanie obrazov.

Text

Riga, Izd-vo "Zinatne", 1974-

1974-19

2 items

FormatCall numberItem location
FormatBook/TextCall number*QHA 75-948 v. 2Item locationOffsite
FormatCall numberItem location
FormatBook/TextCall number*QHA 75-948 v. 1Item locationOffsite

Classification, estimation, and pattern recognition [by] Tzay Y. Young [and] Thomas W. Calvert.

Text

New York, American Elsevier Pub. Co. [1974]

1974

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSD 75-1251Item locationOffsite

Practical approach to pattern classification / Bruce G. Batchelor.

Text

London ; New York : Plenum Press, 1974.

1974

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSE 77-26Item locationOffsite

Methoden der Mustererkennung.

Text

Frankfurt am Main, Akademische Verlagsgesellschaft, 1974.

1974

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSD 76-868Item locationOffsite

Digital pattern recognition / edited by K. S. Fu ; with contributions by T. M. Cover ... [et al.].

Text

Berlin ; New York : Springer-Verlag, 1976.

1976

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSE 76-799Item locationOffsite

Syntactic pattern recognition : applications / edited by K. S. Fu ; with contributions by J. E. Albus ... [et al.].

Text

Berlin ; New York : Springer-Verlag, 1977.

1977

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSE 77-677Item locationOffsite

Proceedings.

Text

Long Beach, Calif., Institue of Electrical and Electronics Engineers.

1973-1978

4 items

FormatCall numberItem location
FormatBook/TextCall numberJSP 77-531 v. 4 (1978)Item locationOffsite
FormatCall numberItem location
FormatBook/TextCall numberJSP 77-531 v. 3 (1976)Item locationOffsite
FormatCall numberItem location
FormatBook/TextCall numberJSP 77-531 v. 2 (1974)Item locationOffsite
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Syntactic pattern recognition : an introduction / Rafael C. Gonzalez, Michael G. Thomason.

Text

Reading, Mass. : Addison-Wesley Pub. Co., Advanced Book Program, 1978.

1978

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSE 79-287Item locationOffsite

Pattern recognition : ideas in practice / edited by Bruce G. Batchelor.

Text

New York : Plenum Press, c1978.

1978

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSE 79-360Item locationOffsite

IEEE transactions on pattern analysis and machine intelligence.

Text

[New York] IEEE Computer Society.

1979-present

51 items

FormatCall numberItem location
FormatBook/TextCall numberJSP 85-603 v. 30, no. 4 (Apr 2008)Item locationOffsite
FormatCall numberItem location
FormatBook/TextCall numberJSP 85-603 v. 30, no. 3 (Mar 2008)Item locationOffsite
FormatCall numberItem location
FormatBook/TextCall numberJSP 85-603 v. 30, no. 2 (Feb 2008)Item locationOffsite

Structural pattern recognition / T. Pavlidis.

Text

Berlin ; New York : Springer-Verlag, 1977.

1977

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSE 80-158Item locationOffsite

Grundlagen der technischen Erkennung / Rolf Peipmann. 1. Aufl.

Text

Berlin : Verlag Technik, 1975.

1975

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSD 81-110Item locationOffsite

Reconnaissance des formes et intelligence artificielle : 2. congrès AFCET-IRIA, Toulouse, 12, 13 14 septembre 1979 / [édité par l'Institut de recherche d'informatique et d'automatique].

Text

Rocquencourt : Institut de recherche d'informatique et d'automatique, 1979.

1979

2 items

FormatCall numberItem location
FormatBook/TextCall numberJSE 82-258 v. 2-3Item locationOffsite
FormatCall numberItem location
FormatBook/TextCall numberJSE 82-258 v. 1Item locationOffsite

Pattern recognition theory and applications : proceedings of the NATO Advanced Study Institute held at St. Anne's College, Oxford, March 29-April 10, 1981 / edited by J. Kittler, K.S. Fu, and L.F. Pau.

Text

Dordrecht, Holland ; Boston : D. Reidel ; Hingham, MA : Sold and distributed in the U.S.A. and Canada by Kluwer Boston, c1982.

1982

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSE 82-436Item locationOffsite

Pattern recognition with fuzzy objective function algorithms / James C. Bezdek.

Text

New York : Plenum Press, c1981.

1981

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSE 81-1646Item locationOffsite

Pattern recognition : a statistical approach / Pierre A. Devijver and Josef Kittler.

Text

Englewood Cliffs, N.J. : Prentice/Hall International, c1982.

1982

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSE 83-337Item locationOffsite

Proceedings / International Conference on Pattern Recognition.

Text

[New York] : Institute of Electrical and Electronics Engineers, c1980-

1980-present

11 items

FormatCall numberItem location
FormatBook/TextCall numberJSP 83-31 1994:v. 3 Item locationOffsite
FormatCall numberItem location
FormatBook/TextCall numberJSP 83-31 1994:v. 2 Item locationOffsite
FormatCall numberItem location
FormatBook/TextCall numberJSP 83-31 1994:v. 1 Item locationOffsite

Proceedings / IEEE Computer Society Conference on Pattern Recognition and Image Processing.

Text

New York : Institute of Electrical and Electronics Engineers, 1977-1982.

1977-1982

3 items

FormatCall numberItem location
FormatBook/TextCall numberJSP 83-203 1979Item locationOffsite
FormatCall numberItem location
FormatBook/TextCall numberJSP 83-203 1981Item locationOffsite
FormatCall numberItem location
FormatBook/TextCall numberJSP 83-203 1982Item locationOffsite

Proceedings : CVPR / IEEE Computer Society Conference on Computer Vision and Pattern Recognition.

Text

Silver Spring, Md. : IEEE Computer Society Press, 1983-

1983-present

21 items

FormatCall numberItem location
FormatBook/TextCall numberJSP 83-204 v. 2 (2005)Item locationOffsite
FormatCall numberItem location
FormatBook/TextCall numberJSP 83-204 v. 2 (2004)Item locationOffsite
FormatCall numberItem location
FormatBook/TextCall numberJSP 83-204 v. 2 (2003)Item locationOffsite

Learning systems : decision, simulation, and control / Yousri M. El-Fattah, Claude Foulard.

Text

Berlin ; New York : Springer-Verlag, 1978.

1978

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSE 84-622Item locationOffsite

Structural methods in pattern recognition / by Laurent Miclet ; translated by J. Howlett.

Text

New York : Springer-Verlag, 1986.

1986

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSE 87-1445Item locationOffsite

Artificial intelligence with statistical pattern recognition / Edward A. Patrick, James M. Fattu.

Text

Englewood Cliffs, N.J. : Prentice-Hall, Business and Professional Division, c1986.

1986

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSE 86-1801Item locationOffsite

Subspace methods of pattern recognition / E. Oja.

Text

Letchworth, Hertfordshire, England : Research Studies Press ; New York : Wiley, c1983.

1983

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSE 86-1752Item locationOffsite

Knowledge as design / D.N. Perkins.

Text

Hillsdale, N.J. : L. Erlbaum Associates, 1986.

1986

1 item

FormatCall numberItem location
FormatBook/TextCall numberJFE 86-5116Item locationSchwarzman Building - General Research Room 315

Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

Temporal-pattern learning in neural models / Carme Torras i Genís.

Text

Berlin ; New York : Springer-Verlag, c1985.

1985

1 item

FormatCall numberItem location
FormatTextCall numberJSK 75-186 v. 62-64Item locationOffsite

Pattern recognition by humans and machines / [edited] by Eileen C. Schwab, Howard C. Nusbaum.

Text

Orlanda, Fla. : Academic Press, 1986.

1986

2 items

FormatCall numberItem location
FormatTextCall numberJFE 87-3826Item locationSchwarzman Building - General Research Room 315

Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

FormatCall numberItem location
FormatTextCall numberJFE 87-3826 v. 2Item locationSchwarzman Building - General Research Room 315

Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

Science on form : proceedings of the First International Symposium for Science on Form, University of Tsukuba, Japan, November 26-30, 1985 / general editor, S. Ishizaka ; editors, Y. Kato, R. Takaki, and J. Toriwaki.

Text

Tokyo : KTK Scientific Publishers ; Dordrecht ; Boston : D. Reidel ; Norwell, MA, U.S.A. : Sold and distributed in the U.S.A. and Canada by Kluwer Academic Publishers, c1987.

1987

1 item

FormatCall numberItem location
FormatTextCall numberJSE 87-2541Item locationOffsite

Reconnaissance des formes et intelligence artificielle : 4ème congrès, Paris, 25-27 janvier 1984 / AFCET, Agence de l'informatique, INRIA.

Text

Paris : AFCET, [1984 or 1985]

1984

2 items

FormatCall numberItem location
FormatBook/TextCall numberJSE 87-2497 v. 2Item locationOffsite
FormatCall numberItem location
FormatBook/TextCall numberJSE 87-2497 v. 1Item locationOffsite

Potential pattern recognition in chemical and medical decision making / D. Coomans, I. Broeckaert.

Text

Letchworth, Hertfordshire, England : Research Studies Press ; New York : Wiley, c1986.

1986

1 item

FormatCall numberItem location
FormatBook/TextCall numberJSE 87-2152Item locationOffsite

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